| Session 4:
Display Measurement Standards & Methods (Display
Measurement) |
| Tuesday, May 20 / 10:50 am
- 12:10 pm / Concourse Hall 152 |
| Chair:
Stephen P. Atwood, Azonix Corp. |
| Co-Chair:
Thomas G. Fiske, Rockwell Collins Display Systems |
|
4.1: |
Tests and Methods of the
ICDM
Joe Miseli, Sun Micorsystems, Inc., Menlo Park, CA, USA
|
|
4.2: |
International Metrology
Standards for Reflective LCDs
Jürgen Laur, autronic-Melchers GmbH, Karlsruhe, Germany |
|
4.3: |
LCD Response-Time
Evaluation in the Presence of Backlight Modulation
Michael Becker, Display-Metrology & Systems, Karlsruhe,
Germany
|
| Session 10:
Characterization of LCD Motion Artifacts (Display
Measurement) |
|
Tuesday, May 20 / 2:00 - 3:20 pm / Concourse Hall 152 |
|
Chair: Frank F. Rochow, LMT Lichtmesstechnik GmbH |
|
Co-Chair:
Michael R. Klein, Photo Research, Inc.
|
|
10.1: |
Evaluation of Moving-Line Contrast
Degradation without Motion
Michael Becker, Display-Metrology & Systems, Karlsruhe,
Germany |
|
10.2: |
Motion-Artifact Analysis
on Scanning-Backlight LCD
Wen Song, Southeast University, Nanjing, China |
|
10.3: |
Overdrive LUT Optimization
for LCD by Box Motion-Blur Measurement and Gamma-Based
Thresholding Method
Hung-Xin Zhao, R2D, Hsinchu, Taiwan |
|
10.4: |
Measurement of
Moving-Picture Resolution for Displays Using Scrolled Sine-Bursts
Isao Kawahara, Matsushita Electric Industrial Co. Ltd., Osaka,
Japan
|
| Session 20:
3-D Applications and Measurement Techniques
(Applications / Display Measurement) |
|
Tuesday, May 20 / 3:40 - 5:00 pm / Room 408A |
|
Chair:
Adi Abileah, Planar Systems, Inc.
|
|
Co-Chair:
Frank F. Rochow, LMT Lichtmesstechnik GmbH
|
|
20.1: |
Mobile 3-D Displays Based
on LTPS 2.4-in. VGA LCD Panel Attached with Lenticular Lens Sheets
Sung-Min Jung, LG.Philips LCD, Kyunggi-do, Korea |
|
20.2: |
Stereoscopic 3-D Display
Using Patterned Retarder
Yu-Jun Wu, AU Optronics Corp., Hsinchu, Taiwan |
|
20.3: |
2-D / 3-D Dual-Image
Switchable Display
Wei-Hung Kuo, AU Optronics Corp., Hsinchu, Taiwan
|
|
20.4
|
Objective Evaluation of
Multi-View Autostereoscopic 3-D Displays
Marja Salmimaa, Nokia Research Center, Tampere, Finland
|
| Poster Session |
Thursday, May 22 / 4:00 - 7:00 pm / Exhibit Hall B
|
|
Display Measurement |
|
P.81: |
A Novel
Moving-Picture Study of the IPS-Mode TV with 120-Hz Driving for
Full-HDTV Application
Se Hong Park, LG.Philips LCD Co., Ltd., Kyunggki-do Korea |
|
P.82: |
Relationship of
Color Distortion on Moving Image and Response Spectrum
Yoshi Enami, Otsuka Electronics Co., Ltd., Shiga, Japan |
|
P.83: |
The Correlation of
MPRT and Moving-Picture Resolution with Actually Perceived
Moving-Image Qualities
Heume-Il Baek, LG.Philips, Anyang, Korea |
|
P.84: |
Luminance and Color
Measurement of LED Backlights with a Hyperspectral Camera
Hsiang-Han Hsu, Center for Measurement Standards, ITRI, Hsinchu,
Taiwan
|
|
P.85: |
Fast Thermal Stress
Estimation Methodology
Ming-Lang Tai, Chunghwa Picture Tubes, Ltd., Taoyuan, Taiwan
|
|
P.86: |
Channel-Dependent
GOG Model for Colorimetric Characterization of LCDs
Chun-hsien Chou, Tatung University, Taipei, Taiwan
|
|
P.87: |
Multi-Channel
Liquid-Crystal Retardation Measurement Technology
Chih-Shang Liu, Industrial Technology Research Institute,
Hsinchu, Taiwan
|
|
P.88: |
WITHDRAWN
|
|
P.89: |
New Multispectral
Fourier-Optics Viewing-Angle Instrument for Full Characterization
of LCDs and Their Components
Pierre Boher, ELDIM, Saint Clair, France
|
|
P.90: |
Quantitative
Analysis of Electrical Mura in LCDs
Yueh-Ping Chang, InnoLux Display Corp., Chunan, Taiwan
|
|
P.91: |
A Method for
Detecting and Classifying the Mura Phenomena in TFT-LCDs
Yung-Hsun Wu, Innolux Display Corp., Miaoli County, Taiwan
|
|
P.92: |
Motion-Blur
Estimation on LCDs
Sylvain Tourancheau, IRCCyN, Nantes, France
|
|
P.93: |
Characterizing
Dielectric Tensors with Biaxial Ellipsometry
Paula Smith, University of Arizona, Tucson, AZ, USA
|
|
P.244: |
Late-News
Poster: Noise and Resolution in a Dual-Layer LCD
Aldo Badano, CDRH/FDA, Silver Spring, MD, USA
|
|
P.253: |
Late-News
Poster: Analysis of LCD Panel Distortion for Touch Mura
Improvement
Heecheol Kim, BOE Optoelectronics Technology Co., Ltd.,
Beijing, China
|
